Determination of wheat spike and spikelet architecture and grain traits using X-ray Computed Tomography imaging

نویسندگان

چکیده

Abstract Background Wheat spike architecture is a key determinant of multiple grain yield components and detailed examination morphometric traits beneficial to explain wheat the effects differing agronomy genetics. However, quantification has been very limited because it relies on time-consuming manual measurements. Results In this study, using X-ray Computed Tomography imaging, we proposed method efficiently detect 3D spikes component spikelets by clustering grains based their Euclidean distance relative positions. Morphometric characteristics grains, e.g., number, size spatial distribution along can be determined. Two commercial cultivars, one old, Maris Widgeon, modern, Siskin, were studied as examples. The average volume Widgeon Siskin did not differ, but had more per therefore greater total spike. length spikelet number statistically different between two cultivars. higher density (number unit length), with than Widgeon. Spatial analysis revealed individual varied volumes from 6, 1–5, compared was similar for Conclusion extract spike, which contribute understanding sink yield.

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ژورنال

عنوان ژورنال: Plant Methods

سال: 2021

ISSN: ['1746-4811']

DOI: https://doi.org/10.1186/s13007-021-00726-5